Calculated Powder X-ray Diffraction Line Profiles via Absorption
نویسنده
چکیده
We have calculated powder X-ray diffraction (PXRD) line profiles based on the absorption of X-rays in passing through materials. The results showed that the line profile function depends on the absorption coefficient of the sample. The observed aluminum PXRD patterns are in excellent agreement with the calculated line profile functions derived from absorption. This work also demonstrated that both Cauchy and Gauss profile fitting functions are the approximation of the calculated line profile obtained in this paper.
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